Posts tagged Semiconductor Inspection
SEMICON Europa 2025

During SEMICON Europa 2025 in Munich, ISDI presented its current portfolio of sensor technologies. The focus included line and area scan sensors, large-area CMOS sensors, silicon strip ROICs for photon counting, and custom ASIC developments. Andrea Fant, Co-Founder and R&D Project Lead, was on site and engaged in several technical discussions with interested companies and partners.

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